TY - JOUR

T1 - Evaluation of X-ray fluorescence for analysing critical elements in three electronic waste matrices

T2 - A comprehensive comparison of analytical techniques

AU - Lancaster, Shaun

AU - Sahlin, Eskil

AU - Oelze, Marcus

AU - Ostermann, Markus

AU - Vogl, Jochen

AU - Laperche, Valérie

AU - Touze, Solène

AU - Ghestem, Jean Philippe

AU - Dalencourt, Claire

AU - Gendre, Régine

AU - Stammeier, Jessica

AU - Klein, Ole

AU - Pröfrock, Daniel

AU - Košarac, Gala

AU - Jotanovic, Aida

AU - Bergamaschi, Luigi

AU - Di Luzio, Marco

AU - D'Agostino, Giancarlo

AU - Jaćimović, Radojko

AU - Eberhard, Melissa

AU - Feiner, Laura

AU - Trimmel, Simone

AU - Rachetti, Alessandra

AU - Sara-Aho, Timo

AU - Röthke, Anita

AU - Michaliszyn, Lena

AU - Pramann, Axel

AU - Rienitz, Olaf

AU - Irrgeher, Johanna

N1 - Publisher Copyright: © 2024 The Author(s)

PY - 2024/10/19

Y1 - 2024/10/19

N2 - As the drive towards recycling electronic waste increases, demand for rapid and reliable analytical methodology to analyse the metal content of the waste is increasing, e.g. to assess the value of the waste and to decide the correct recycling routes. Here, we comprehensively assess the suitability of different x-ray fluorescence spectroscopy (XRF)-based techniques as rapid analytical tools for the determination of critical raw materials, such as Al, Ti, Mn, Fe, Co, Ni, Cu, Zn, Nb, Pd and Au, in three electronic waste matrices: printed circuit boards (PCB), light emitting diodes (LED), and lithium (Li)-ion batteries. As validated reference methods and materials to establish metrological traceability are lacking, several laboratories measured test samples of each matrix using XRF as well as other independent complementary techniques (instrumental neutron activation analysis (INAA), inductively coupled plasma mass spectrometry (ICP-MS) and ICP optical emission spectrometry (OES)) as an inter-laboratory comparison (ILC). Results highlighted key aspects of sample preparation, limits of detection, and spectral interferences that affect the reliability of XRF, while additionally highlighting that XRF can provide more reliable data for certain elements compared to digestion-based approaches followed by ICP-MS analysis (e.g. group 4 and 5 metals). A clear distinction was observed in data processing methodologies for wavelength dispersive XRF, highlighting that considering the metals present as elements (rather than oxides) induces overestimations of the mass fractions when compared to other techniques. Eventually, the effect of sample particle size was studied and indicated that smaller particle size (<200 µm) is essential for reliable determinations.

AB - As the drive towards recycling electronic waste increases, demand for rapid and reliable analytical methodology to analyse the metal content of the waste is increasing, e.g. to assess the value of the waste and to decide the correct recycling routes. Here, we comprehensively assess the suitability of different x-ray fluorescence spectroscopy (XRF)-based techniques as rapid analytical tools for the determination of critical raw materials, such as Al, Ti, Mn, Fe, Co, Ni, Cu, Zn, Nb, Pd and Au, in three electronic waste matrices: printed circuit boards (PCB), light emitting diodes (LED), and lithium (Li)-ion batteries. As validated reference methods and materials to establish metrological traceability are lacking, several laboratories measured test samples of each matrix using XRF as well as other independent complementary techniques (instrumental neutron activation analysis (INAA), inductively coupled plasma mass spectrometry (ICP-MS) and ICP optical emission spectrometry (OES)) as an inter-laboratory comparison (ILC). Results highlighted key aspects of sample preparation, limits of detection, and spectral interferences that affect the reliability of XRF, while additionally highlighting that XRF can provide more reliable data for certain elements compared to digestion-based approaches followed by ICP-MS analysis (e.g. group 4 and 5 metals). A clear distinction was observed in data processing methodologies for wavelength dispersive XRF, highlighting that considering the metals present as elements (rather than oxides) induces overestimations of the mass fractions when compared to other techniques. Eventually, the effect of sample particle size was studied and indicated that smaller particle size (<200 µm) is essential for reliable determinations.

KW - Battery

KW - LED

KW - PCB

KW - Recycling

KW - WEEE

KW - XRF

UR - http://www.scopus.com/inward/record.url?scp=85206630750&partnerID=8YFLogxK

U2 - 10.1016/j.wasman.2024.10.015

DO - 10.1016/j.wasman.2024.10.015

M3 - Article

C2 - 39427594

AN - SCOPUS:85206630750

VL - 190.2024

SP - 496

EP - 505

JO - Waste management

JF - Waste management

SN - 0956-053X

IS - 15 December

ER -