Effects of laser wavelength and pulse energy on the evaporation behavior of TiN coatings in atom probe tomography: A multi-instrument study

Publikationen: Beitrag in FachzeitschriftArtikelForschung(peer-reviewed)

Standard

Effects of laser wavelength and pulse energy on the evaporation behavior of TiN coatings in atom probe tomography: A multi-instrument study. / Schiester, Maximilian; Waldl, Helene; Rice, Katherine P. et al.
in: Ultramicroscopy, Jahrgang 270.2025, Nr. April, 114105, 17.01.2025.

Publikationen: Beitrag in FachzeitschriftArtikelForschung(peer-reviewed)

Vancouver

Schiester M, Waldl H, Rice KP, Hans M, Primetzhofer D, Schalk N et al. Effects of laser wavelength and pulse energy on the evaporation behavior of TiN coatings in atom probe tomography: A multi-instrument study. Ultramicroscopy. 2025 Jan 17;270.2025(April):114105. doi: 10.1016/j.ultramic.2025.114105

Bibtex - Download

@article{01de36b192944032804a02f3b54941cd,
title = "Effects of laser wavelength and pulse energy on the evaporation behavior of TiN coatings in atom probe tomography: A multi-instrument study",
abstract = "The impact of the laser wavelength on accuracy in elemental composition analysis in atom probe tomography (APT) was investigated. Three different commercial atom probe systems — LEAP 3000X HR, LEAP 5000 XR, and LEAP 6000 XR — were systematically compared for a TiN model coating studying the effect of shorter laser wavelengths, especially in the deep ultraviolet (DUV) range, on the evaporation behavior. The findings demonstrate that the use of shorter wavelengths enhances the accuracy in elemental composition, while maintaining similar electric field strengths. Thus, thermal effects are reduced, which in turn improves mass resolving power. An important aspect of this research includes the estimation of energy density ratios of the different instruments. The reduction in wavelength is accompanied by increasing energy densities due to smaller laser spot sizes. Furthermore, advancements in the detector technology were studied. Finally, the detector dead-times were determined and dead-zones were evaluated to investigate the ion pile-up behavior in APT measurements of nitrides with the LEAP 6000 XR.",
author = "Maximilian Schiester and Helene Waldl and Rice, {Katherine P.} and Marcus Hans and Daniel Primetzhofer and Nina Schalk and Michael Tkadletz",
year = "2025",
month = jan,
day = "17",
doi = "10.1016/j.ultramic.2025.114105",
language = "English",
volume = "270.2025",
journal = "Ultramicroscopy",
issn = "0304-3991",
publisher = "Elsevier",
number = "April",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - Effects of laser wavelength and pulse energy on the evaporation behavior of TiN coatings in atom probe tomography

T2 - A multi-instrument study

AU - Schiester, Maximilian

AU - Waldl, Helene

AU - Rice, Katherine P.

AU - Hans, Marcus

AU - Primetzhofer, Daniel

AU - Schalk, Nina

AU - Tkadletz, Michael

PY - 2025/1/17

Y1 - 2025/1/17

N2 - The impact of the laser wavelength on accuracy in elemental composition analysis in atom probe tomography (APT) was investigated. Three different commercial atom probe systems — LEAP 3000X HR, LEAP 5000 XR, and LEAP 6000 XR — were systematically compared for a TiN model coating studying the effect of shorter laser wavelengths, especially in the deep ultraviolet (DUV) range, on the evaporation behavior. The findings demonstrate that the use of shorter wavelengths enhances the accuracy in elemental composition, while maintaining similar electric field strengths. Thus, thermal effects are reduced, which in turn improves mass resolving power. An important aspect of this research includes the estimation of energy density ratios of the different instruments. The reduction in wavelength is accompanied by increasing energy densities due to smaller laser spot sizes. Furthermore, advancements in the detector technology were studied. Finally, the detector dead-times were determined and dead-zones were evaluated to investigate the ion pile-up behavior in APT measurements of nitrides with the LEAP 6000 XR.

AB - The impact of the laser wavelength on accuracy in elemental composition analysis in atom probe tomography (APT) was investigated. Three different commercial atom probe systems — LEAP 3000X HR, LEAP 5000 XR, and LEAP 6000 XR — were systematically compared for a TiN model coating studying the effect of shorter laser wavelengths, especially in the deep ultraviolet (DUV) range, on the evaporation behavior. The findings demonstrate that the use of shorter wavelengths enhances the accuracy in elemental composition, while maintaining similar electric field strengths. Thus, thermal effects are reduced, which in turn improves mass resolving power. An important aspect of this research includes the estimation of energy density ratios of the different instruments. The reduction in wavelength is accompanied by increasing energy densities due to smaller laser spot sizes. Furthermore, advancements in the detector technology were studied. Finally, the detector dead-times were determined and dead-zones were evaluated to investigate the ion pile-up behavior in APT measurements of nitrides with the LEAP 6000 XR.

U2 - 10.1016/j.ultramic.2025.114105

DO - 10.1016/j.ultramic.2025.114105

M3 - Article

VL - 270.2025

JO - Ultramicroscopy

JF - Ultramicroscopy

SN - 0304-3991

IS - April

M1 - 114105

ER -