Conventional TEM investigation of the FIB damage in copper
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
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Conventional TEM investigation of the FIB damage in copper. / Kiener, Daniel; Jörg, Thomas; Rester, Martin et al.
in: Microscopy and microanalysis, Jahrgang 13, 2007, S. 100-101.
in: Microscopy and microanalysis, Jahrgang 13, 2007, S. 100-101.
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Harvard
Kiener, D, Jörg, T, Rester, M, Motz, C & Dehm, G 2007, 'Conventional TEM investigation of the FIB damage in copper', Microscopy and microanalysis, Jg. 13, S. 100-101.
APA
Kiener, D., Jörg, T., Rester, M., Motz, C., & Dehm, G. (2007). Conventional TEM investigation of the FIB damage in copper. Microscopy and microanalysis, 13, 100-101.
Vancouver
Kiener D, Jörg T, Rester M, Motz C, Dehm G. Conventional TEM investigation of the FIB damage in copper. Microscopy and microanalysis. 2007;13:100-101.
Author
Bibtex - Download
@article{a1370f9f9b584e858a6b50d8460477d5,
title = "Conventional TEM investigation of the FIB damage in copper",
author = "Daniel Kiener and Thomas J{\"o}rg and Martin Rester and Christian Motz and Gerhard Dehm",
year = "2007",
language = "English",
volume = "13",
pages = "100--101",
journal = "Microscopy and microanalysis",
issn = "1431-9276",
publisher = "Cambridge University Press",
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - Conventional TEM investigation of the FIB damage in copper
AU - Kiener, Daniel
AU - Jörg, Thomas
AU - Rester, Martin
AU - Motz, Christian
AU - Dehm, Gerhard
PY - 2007
Y1 - 2007
M3 - Article
VL - 13
SP - 100
EP - 101
JO - Microscopy and microanalysis
JF - Microscopy and microanalysis
SN - 1431-9276
ER -
