Comparison of CMOS and CCD cameras for laser profiling

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Comparison of CMOS and CCD cameras for laser profiling. / Koller, Norbert; O'Leary, Paul; Lee, Peter.
in: Proceedings of SPIE - The International Society for Optical Engineering, Jahrgang 5303, 01.12.2004, S. 108-115.

Publikationen: Beitrag in FachzeitschriftKonferenzartikel(peer-reviewed)

Bibtex - Download

@article{c4b568b195054bf8a3fd2b4991fbc9e2,
title = "Comparison of CMOS and CCD cameras for laser profiling",
keywords = "CCD-Cameras, CMOS-Cameras, Differential Imaging, Dynamic Range, Laser Profiling",
author = "Norbert Koller and Paul O'Leary and Peter Lee",
year = "2004",
month = dec,
day = "1",
doi = "10.1117/12.529868",
language = "English",
volume = "5303",
pages = "108--115",
journal = "Proceedings of SPIE - The International Society for Optical Engineering",
issn = "0277-786X",
publisher = "SPIE",
note = "Machine Vision Applications in Industrial Inspection XII ; Conference date: 21-01-2004 Through 22-01-2004",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - Comparison of CMOS and CCD cameras for laser profiling

AU - Koller, Norbert

AU - O'Leary, Paul

AU - Lee, Peter

PY - 2004/12/1

Y1 - 2004/12/1

KW - CCD-Cameras

KW - CMOS-Cameras

KW - Differential Imaging

KW - Dynamic Range

KW - Laser Profiling

UR - http://www.scopus.com/inward/record.url?scp=8844287552&partnerID=8YFLogxK

U2 - 10.1117/12.529868

DO - 10.1117/12.529868

M3 - Conference article

AN - SCOPUS:8844287552

VL - 5303

SP - 108

EP - 115

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

SN - 0277-786X

T2 - Machine Vision Applications in Industrial Inspection XII

Y2 - 21 January 2004 through 22 January 2004

ER -