Characterization of Ni-Pt-O microstructures by analytical electron microscopy
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Standard
Characterization of Ni-Pt-O microstructures by analytical electron microscopy. / Rom, I.; Schröder, Alexandra; Hofer, F. et al.
Mass and Charge Transport in Inorganic Materials: Fundamentals to Devices B. 2000. S. 621-626.
Mass and Charge Transport in Inorganic Materials: Fundamentals to Devices B. 2000. S. 621-626.
Publikationen: Beitrag in Buch/Bericht/Konferenzband › Beitrag in Konferenzband
Harvard
Rom, I, Schröder, A, Hofer, F, Sitte, W & Grogger, W 2000, Characterization of Ni-Pt-O microstructures by analytical electron microscopy. in Mass and Charge Transport in Inorganic Materials: Fundamentals to Devices B. S. 621-626.
APA
Rom, I., Schröder, A., Hofer, F., Sitte, W., & Grogger, W. (2000). Characterization of Ni-Pt-O microstructures by analytical electron microscopy. In Mass and Charge Transport in Inorganic Materials: Fundamentals to Devices B (S. 621-626)
Vancouver
Rom I, Schröder A, Hofer F, Sitte W, Grogger W. Characterization of Ni-Pt-O microstructures by analytical electron microscopy. in Mass and Charge Transport in Inorganic Materials: Fundamentals to Devices B. 2000. S. 621-626
Author
Bibtex - Download
@inproceedings{a0d6daf22501444ea4b731bba5fa3ca5,
title = "Characterization of Ni-Pt-O microstructures by analytical electron microscopy",
author = "I. Rom and Alexandra Schr{\"o}der and F. Hofer and Werner Sitte and W. Grogger",
year = "2000",
language = "English",
pages = "621--626",
booktitle = "Mass and Charge Transport in Inorganic Materials: Fundamentals to Devices B",
}
RIS (suitable for import to EndNote) - Download
TY - GEN
T1 - Characterization of Ni-Pt-O microstructures by analytical electron microscopy
AU - Rom, I.
AU - Schröder, Alexandra
AU - Hofer, F.
AU - Sitte, Werner
AU - Grogger, W.
PY - 2000
Y1 - 2000
M3 - Conference contribution
SP - 621
EP - 626
BT - Mass and Charge Transport in Inorganic Materials: Fundamentals to Devices B
ER -