Characterization of a SiC/SiC composite by X-ray diffraction, atomic force microscopy and positron spectroscopies
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Standard
Characterization of a SiC/SiC composite by X-ray diffraction, atomic force microscopy and positron spectroscopies. / Brauer, G.; Anwand, W.; Eichhorn, E. et al.
in: Applied surface science, Jahrgang 252, 2006, S. 3342-3351.
in: Applied surface science, Jahrgang 252, 2006, S. 3342-3351.
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Harvard
Brauer, G, Anwand, W, Eichhorn, E, Skorupa, W, Hofer, C, Teichert, C, Kuriplach, J, Cizek, J, Prochazka, I, Coleman, PG, Nozawa, T & Kohyama, A 2006, 'Characterization of a SiC/SiC composite by X-ray diffraction, atomic force microscopy and positron spectroscopies', Applied surface science, Jg. 252, S. 3342-3351. https://doi.org/10.1016/j.apsusc.2005.08.096
APA
Brauer, G., Anwand, W., Eichhorn, E., Skorupa, W., Hofer, C., Teichert, C., Kuriplach, J., Cizek, J., Prochazka, I., Coleman, P. G., Nozawa, T., & Kohyama, A. (2006). Characterization of a SiC/SiC composite by X-ray diffraction, atomic force microscopy and positron spectroscopies. Applied surface science, 252, 3342-3351. https://doi.org/10.1016/j.apsusc.2005.08.096
Vancouver
Brauer G, Anwand W, Eichhorn E, Skorupa W, Hofer C, Teichert C et al. Characterization of a SiC/SiC composite by X-ray diffraction, atomic force microscopy and positron spectroscopies. Applied surface science. 2006;252:3342-3351. doi: 10.1016/j.apsusc.2005.08.096
Author
Bibtex - Download
@article{9c2c951a3d1e4bd48aa9632dfad45afd,
title = "Characterization of a SiC/SiC composite by X-ray diffraction, atomic force microscopy and positron spectroscopies",
author = "G. Brauer and W. Anwand and E. Eichhorn and W. Skorupa and Christian Hofer and Christian Teichert and J. Kuriplach and J. Cizek and I. Prochazka and P.G. Coleman and T. Nozawa and A. Kohyama",
year = "2006",
doi = "10.1016/j.apsusc.2005.08.096",
language = "English",
volume = "252",
pages = "3342--3351",
journal = "Applied surface science",
issn = "0169-4332",
publisher = "Elsevier",
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - Characterization of a SiC/SiC composite by X-ray diffraction, atomic force microscopy and positron spectroscopies
AU - Brauer, G.
AU - Anwand, W.
AU - Eichhorn, E.
AU - Skorupa, W.
AU - Hofer, Christian
AU - Teichert, Christian
AU - Kuriplach, J.
AU - Cizek, J.
AU - Prochazka, I.
AU - Coleman, P.G.
AU - Nozawa, T.
AU - Kohyama, A.
PY - 2006
Y1 - 2006
U2 - 10.1016/j.apsusc.2005.08.096
DO - 10.1016/j.apsusc.2005.08.096
M3 - Article
VL - 252
SP - 3342
EP - 3351
JO - Applied surface science
JF - Applied surface science
SN - 0169-4332
ER -
