Ballistic Electron Emission Spectroscopy Used as a Tool for Determining Accurate Hot-Electron Lifetimes in Metals
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Scanning tunnelling microscopy/spectroscopy and related techniques: 12th International Conference STM'03. 2003. S. 829 (AIP Conference Proceedings; Band 696).
Publikationen: Beitrag in Buch/Bericht/Konferenzband › Beitrag in Konferenzband
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TY - GEN
T1 - Ballistic Electron Emission Spectroscopy Used as a Tool for Determining Accurate Hot-Electron Lifetimes in Metals
AU - De Pablos, Pilar F.
AU - De Andres, Petro L.
AU - Ladstädter, F.
AU - Hohenester, U.
AU - Puschnig, Peter
AU - Draxl, Claudia
AU - Garcia-Vidal, Francisco J.
AU - Flores, Fernando
PY - 2003
Y1 - 2003
U2 - 10.1063/1.1639790
DO - 10.1063/1.1639790
M3 - Conference contribution
T3 - AIP Conference Proceedings
SP - 829
BT - Scanning tunnelling microscopy/spectroscopy and related techniques
ER -