Ballistic Electron Emission Spectroscopy Used as a Tool for Determining Accurate Hot-Electron Lifetimes in Metals

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Standard

Ballistic Electron Emission Spectroscopy Used as a Tool for Determining Accurate Hot-Electron Lifetimes in Metals. / De Pablos, Pilar F.; De Andres, Petro L.; Ladstädter, F. et al.
Scanning tunnelling microscopy/spectroscopy and related techniques: 12th International Conference STM'03. 2003. S. 829 (AIP Conference Proceedings; Band 696).

Publikationen: Beitrag in Buch/Bericht/KonferenzbandBeitrag in Konferenzband

Harvard

De Pablos, PF, De Andres, PL, Ladstädter, F, Hohenester, U, Puschnig, P, Draxl, C, Garcia-Vidal, FJ & Flores, F 2003, Ballistic Electron Emission Spectroscopy Used as a Tool for Determining Accurate Hot-Electron Lifetimes in Metals. in Scanning tunnelling microscopy/spectroscopy and related techniques: 12th International Conference STM'03. AIP Conference Proceedings, Bd. 696, S. 829. https://doi.org/10.1063/1.1639790

APA

De Pablos, P. F., De Andres, P. L., Ladstädter, F., Hohenester, U., Puschnig, P., Draxl, C., Garcia-Vidal, F. J., & Flores, F. (2003). Ballistic Electron Emission Spectroscopy Used as a Tool for Determining Accurate Hot-Electron Lifetimes in Metals. In Scanning tunnelling microscopy/spectroscopy and related techniques: 12th International Conference STM'03 (S. 829). (AIP Conference Proceedings; Band 696). https://doi.org/10.1063/1.1639790

Vancouver

De Pablos PF, De Andres PL, Ladstädter F, Hohenester U, Puschnig P, Draxl C et al. Ballistic Electron Emission Spectroscopy Used as a Tool for Determining Accurate Hot-Electron Lifetimes in Metals. in Scanning tunnelling microscopy/spectroscopy and related techniques: 12th International Conference STM'03. 2003. S. 829. (AIP Conference Proceedings). doi: 10.1063/1.1639790

Author

De Pablos, Pilar F. ; De Andres, Petro L. ; Ladstädter, F. et al. / Ballistic Electron Emission Spectroscopy Used as a Tool for Determining Accurate Hot-Electron Lifetimes in Metals. Scanning tunnelling microscopy/spectroscopy and related techniques: 12th International Conference STM'03. 2003. S. 829 (AIP Conference Proceedings).

Bibtex - Download

@inproceedings{34fffa050fae4c698d2633c3ee1b0713,
title = "Ballistic Electron Emission Spectroscopy Used as a Tool for Determining Accurate Hot-Electron Lifetimes in Metals",
author = "{De Pablos}, {Pilar F.} and {De Andres}, {Petro L.} and F. Ladst{\"a}dter and U. Hohenester and Peter Puschnig and Claudia Draxl and Garcia-Vidal, {Francisco J.} and Fernando Flores",
year = "2003",
doi = "10.1063/1.1639790",
language = "English",
series = "AIP Conference Proceedings",
pages = "829",
booktitle = "Scanning tunnelling microscopy/spectroscopy and related techniques",

}

RIS (suitable for import to EndNote) - Download

TY - GEN

T1 - Ballistic Electron Emission Spectroscopy Used as a Tool for Determining Accurate Hot-Electron Lifetimes in Metals

AU - De Pablos, Pilar F.

AU - De Andres, Petro L.

AU - Ladstädter, F.

AU - Hohenester, U.

AU - Puschnig, Peter

AU - Draxl, Claudia

AU - Garcia-Vidal, Francisco J.

AU - Flores, Fernando

PY - 2003

Y1 - 2003

U2 - 10.1063/1.1639790

DO - 10.1063/1.1639790

M3 - Conference contribution

T3 - AIP Conference Proceedings

SP - 829

BT - Scanning tunnelling microscopy/spectroscopy and related techniques

ER -