Automatic etch pit detection and characterization in KOH etch images of 4H-SiC using deep learning
Publikationen: Konferenzbeitrag › Poster › Forschung › (peer-reviewed)
Standard
Automatic etch pit detection and characterization in KOH etch images of 4H-SiC using deep learning. / Holub, Georg; Hofer, Sebastian; Obermüller, Thomas et al.
2024. Postersitzung präsentiert bei International Conference on Silicon Carbide and Related Materials (ICSCRM 2024), North Carolina, USA / Vereinigte Staaten.
2024. Postersitzung präsentiert bei International Conference on Silicon Carbide and Related Materials (ICSCRM 2024), North Carolina, USA / Vereinigte Staaten.
Publikationen: Konferenzbeitrag › Poster › Forschung › (peer-reviewed)
Harvard
Holub, G, Hofer, S, Obermüller, T & Romaner, L 2024, 'Automatic etch pit detection and characterization in KOH etch images of 4H-SiC using deep learning', International Conference on Silicon Carbide and Related Materials (ICSCRM 2024), North Carolina, USA / Vereinigte Staaten, 29/09/24 - 4/10/24.
APA
Holub, G., Hofer, S., Obermüller, T., & Romaner, L. (2024). Automatic etch pit detection and characterization in KOH etch images of 4H-SiC using deep learning. Postersitzung präsentiert bei International Conference on Silicon Carbide and Related Materials (ICSCRM 2024), North Carolina, USA / Vereinigte Staaten.
Vancouver
Holub G, Hofer S, Obermüller T, Romaner L. Automatic etch pit detection and characterization in KOH etch images of 4H-SiC using deep learning. 2024. Postersitzung präsentiert bei International Conference on Silicon Carbide and Related Materials (ICSCRM 2024), North Carolina, USA / Vereinigte Staaten.
Author
Bibtex - Download
@conference{c355f5ad44994a839a636b5f882c1042,
title = "Automatic etch pit detection and characterization in KOH etch images of 4H-SiC using deep learning",
author = "Georg Holub and Sebastian Hofer and Thomas Oberm{\"u}ller and Lorenz Romaner",
year = "2024",
language = "English",
note = "International Conference on Silicon Carbide and Related Materials (ICSCRM 2024) ; Conference date: 29-09-2024 Through 04-10-2024",
}
RIS (suitable for import to EndNote) - Download
TY - CONF
T1 - Automatic etch pit detection and characterization in KOH etch images of 4H-SiC using deep learning
AU - Holub, Georg
AU - Hofer, Sebastian
AU - Obermüller, Thomas
AU - Romaner, Lorenz
PY - 2024
Y1 - 2024
M3 - Poster
T2 - International Conference on Silicon Carbide and Related Materials (ICSCRM 2024)
Y2 - 29 September 2024 through 4 October 2024
ER -
