Automatic defect classification in inductive thermo-graphical testing
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Automatic defect classification in inductive thermo-graphical testing. / Oswald-Tranta, Beata; Sorger, Mario.
QIRT 2010, Proceedings. 2010. S. 511-517.
QIRT 2010, Proceedings. 2010. S. 511-517.
Publikationen: Beitrag in Buch/Bericht/Konferenzband › Beitrag in Konferenzband
Harvard
Oswald-Tranta, B & Sorger, M 2010, Automatic defect classification in inductive thermo-graphical testing. in QIRT 2010, Proceedings. S. 511-517.
APA
Oswald-Tranta, B., & Sorger, M. (2010). Automatic defect classification in inductive thermo-graphical testing. In QIRT 2010, Proceedings (S. 511-517)
Vancouver
Oswald-Tranta B, Sorger M. Automatic defect classification in inductive thermo-graphical testing. in QIRT 2010, Proceedings. 2010. S. 511-517
Author
Bibtex - Download
@inproceedings{5cd12c15fa3a494a97feb63c993db825,
title = "Automatic defect classification in inductive thermo-graphical testing",
author = "Beata Oswald-Tranta and Mario Sorger",
year = "2010",
language = "English",
isbn = "978-2-9809199-1-6",
pages = "511--517",
booktitle = "QIRT 2010, Proceedings",
}
RIS (suitable for import to EndNote) - Download
TY - GEN
T1 - Automatic defect classification in inductive thermo-graphical testing
AU - Oswald-Tranta, Beata
AU - Sorger, Mario
PY - 2010
Y1 - 2010
M3 - Conference contribution
SN - 978-2-9809199-1-6
SP - 511
EP - 517
BT - QIRT 2010, Proceedings
ER -
