Addressing Fracture Properties of Individual Constituents Within a Cu-WTi-SiOx-Si Multilayer
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
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in: JOM, Jahrgang 72.2020, Nr. 12, 10.11.2020, S. 4551-4558.
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
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TY - JOUR
T1 - Addressing Fracture Properties of Individual Constituents Within a Cu-WTi-SiOx-Si Multilayer
AU - Alfreider, Markus
AU - Zechner, Johannes
AU - Kiener, Daniel
PY - 2020/11/10
Y1 - 2020/11/10
UR - http://www.scopus.com/inward/record.url?scp=85095753070&partnerID=8YFLogxK
U2 - 10.1007/s11837-020-04444-6
DO - 10.1007/s11837-020-04444-6
M3 - Article
AN - SCOPUS:85095753070
VL - 72.2020
SP - 4551
EP - 4558
JO - JOM
JF - JOM
SN - 1047-4838
IS - 12
ER -