Addressing Fracture Properties of Individual Constituents Within a Cu-WTi-SiOx-Si Multilayer

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Addressing Fracture Properties of Individual Constituents Within a Cu-WTi-SiOx-Si Multilayer. / Alfreider, Markus; Zechner, Johannes; Kiener, Daniel.
in: JOM, Jahrgang 72.2020, Nr. 12, 10.11.2020, S. 4551-4558.

Publikationen: Beitrag in FachzeitschriftArtikelForschung(peer-reviewed)

Vancouver

Alfreider M, Zechner J, Kiener D. Addressing Fracture Properties of Individual Constituents Within a Cu-WTi-SiOx-Si Multilayer. JOM. 2020 Nov 10;72.2020(12):4551-4558. doi: 10.1007/s11837-020-04444-6

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Bibtex - Download

@article{f1d3b9bd2f154bce89e1a41fd34d3cfe,
title = "Addressing Fracture Properties of Individual Constituents Within a Cu-WTi-SiOx-Si Multilayer",
author = "Markus Alfreider and Johannes Zechner and Daniel Kiener",
year = "2020",
month = nov,
day = "10",
doi = "10.1007/s11837-020-04444-6",
language = "English",
volume = "72.2020",
pages = "4551--4558",
journal = "JOM",
issn = "1047-4838",
publisher = "Minerals, Metals and Materials Society",
number = "12",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - Addressing Fracture Properties of Individual Constituents Within a Cu-WTi-SiOx-Si Multilayer

AU - Alfreider, Markus

AU - Zechner, Johannes

AU - Kiener, Daniel

PY - 2020/11/10

Y1 - 2020/11/10

UR - http://www.scopus.com/inward/record.url?scp=85095753070&partnerID=8YFLogxK

U2 - 10.1007/s11837-020-04444-6

DO - 10.1007/s11837-020-04444-6

M3 - Article

AN - SCOPUS:85095753070

VL - 72.2020

SP - 4551

EP - 4558

JO - JOM

JF - JOM

SN - 1047-4838

IS - 12

ER -