A novel approach for site-specific atom probe specimen preparation by focused ion beam and transmission electron backscatter diffraction
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
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A novel approach for site-specific atom probe specimen preparation by focused ion beam and transmission electron backscatter diffraction. / Babinsky, Katharina; De Kloe, R.; Clemens, Helmut et al.
in: Ultramicroscopy, Jahrgang 144, 2014, S. 9-18.
in: Ultramicroscopy, Jahrgang 144, 2014, S. 9-18.
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
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Babinsky K, De Kloe R, Clemens H, Primig S. A novel approach for site-specific atom probe specimen preparation by focused ion beam and transmission electron backscatter diffraction. Ultramicroscopy. 2014;144:9-18. doi: 10.1016/j.ultramic.2014.04.003
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@article{267b573f4e6f4c1aa6bf29c59a215455,
title = "A novel approach for site-specific atom probe specimen preparation by focused ion beam and transmission electron backscatter diffraction",
author = "Katharina Babinsky and {De Kloe}, R. and Helmut Clemens and Sophie Primig",
year = "2014",
doi = "10.1016/j.ultramic.2014.04.003",
language = "English",
volume = "144",
pages = "9--18",
journal = "Ultramicroscopy",
issn = "1879-2723",
publisher = "Elsevier",
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - A novel approach for site-specific atom probe specimen preparation by focused ion beam and transmission electron backscatter diffraction
AU - Babinsky, Katharina
AU - De Kloe, R.
AU - Clemens, Helmut
AU - Primig, Sophie
PY - 2014
Y1 - 2014
U2 - 10.1016/j.ultramic.2014.04.003
DO - 10.1016/j.ultramic.2014.04.003
M3 - Article
VL - 144
SP - 9
EP - 18
JO - Ultramicroscopy
JF - Ultramicroscopy
SN - 1879-2723
ER -
