Anisotropic wet-chemical etching for preparation of freestanding films on Si substrates for atom probe tomography: A simple yet effective approach

Tkadletz, M., Lechner, A., Pölzl, S. & Schalk, N., Nov. 2021, in: Ultramicroscopy. 230, 113402, S. 1-4 113402.

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Analysis of nanoscale fluid inclusions in geomaterials by atom probe tomography: Experiments and numerical simulations

Dubosq, R., Gault, B., Hatzoglou, C., Schweinar, K., Vurpillot, F., Rogowitz, A., Rantitsch, G. & Schneider, D., Nov. 2020, in: Ultramicroscopy. 218.2020, November, 10 S., 113092.

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A method for a column-by-column EELS quantification of barium lanthanum ferrate

Lammer, J., Berger, C., Löffler, S., Knez, D., Longo, P., Kothleitner, G., Hofer, F., Haberfehlner, G., Bucher, E., Sitte, W. & Grogger, W., Apr. 2022, in: Ultramicroscopy. 234.2022, April, 9 S., 113477.

Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)