Thiol‐Ene versus Binary Thiol–Acrylate Chemistry: Material Properties and Network Characteristics of Photopolymers

Sahin, M., Ayalur Karunakaran, S., Manhart, J. C., Wolfahrt, M., Kern, W. & Schlögl, S., 2016, in: Advanced engineering materials. 2016, 19, 19.

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Thiol-Ene versus Binary Thiol–Acrylate Chemistry: Material Properties and Network Characteristics of Photopolymers

Sahin, M., Ayalur-Karunakaran, S., Manhart, J., Wolfahrt, M., Kern, W. & Schlögl, S., 23 Nov. 2016, (Elektronische Veröffentlichung vor Drucklegung.) in: Advanced engineering materials. 19.2017, 4, 10 S., 1600620.

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3D Printing of Soft Magnetoactive Devices with Thiol-Click Photopolymer Composites

Rossegger, E., Höller, R., Hrbinič, K., Sangermano, M., Griesser, T. & Schlögl, S., 26 Juli 2022, (Elektronische Veröffentlichung vor Drucklegung.) in: Advanced engineering materials. 25.2022, 7, 9 S., 2200749.

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In Situ Observations of the Microstructural Evolution during Heat Treatment of a PH 13-8 Mo Maraging Steel

Rosenauer, A., Brandl, D., Ressel, G., Lukas, S., Gruber, C., Stockinger, M. & Schnitzer, R., Juni 2023, in: Advanced engineering materials. 25.2023, 12, 12 S., 2300410.

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Influence of grain shape and orientation on the mechanical properties of high pressure torsion deformed nickel

Renk, O., Hohenwarter, A. & Pippan, R., 2012, in: Advanced engineering materials. 11, S. 948-954

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Saturation of grain fragmentation upon severe plastic Deformation: Fact or fiction?

Renk, O., Hohenwarter, A., Edalati, K. & Kapp, M. W., 14 Juni 2024, in: Advanced engineering materials. 26.2024, 19, 12 S.

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Evaluating High-Pressure Torsion Scale-Up

Reis, L. M., Hohenwarter, A., Kawasaki, M. & Figueiredo, R. B., 22 Feb. 2024, in: Advanced Engineering Materials. 26.2024, 19, 11 S., 2400175.

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Piezotronic Effect on Electrical Characteristics of Bulk ZnO Varistors

Raidl, N., Hofstätter, M. & Supancic, P. H., 2017, in: Advanced engineering materials. 19, 4

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Electromechanical Behavior of Al/Al2O3 Multilayers on Flexible Substrates: Insights from In Situ Film Stress and Resistance Measurements

Putz, B., Edwards, T. E. J., Huszar, E., Gruber, P. A., Gradwohl, K.-P., Kreiml, P., Többens, D. & Michler, J., 2023, in: Advanced engineering materials. 24.2022, 15 S., 2200951.

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Atomistic Modelling of Optical Properties of Thin Films

Puschnig, P. & Ambrosch-Draxl, C., 2006, in: Advanced engineering materials. 8, S. 1151-1155

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